发明名称 Methods of manufacturing non-volatile memory devices by implanting metal ions into grain boundaries of variable resistance layers
摘要 Integrated circuit nonvolatile memory devices are manufactured by forming a variable resistance layer on an integrated circuit substrate. The variable resistance layer includes grains that define grain boundaries between the grains. Conductive filaments are formed along at least some of the grain boundaries. Electrodes are formed on the variable resistance layer. The conductive filaments may be formed by implanting conductive ions into at least some of the grain boundaries. Moreover, the variable resistance layer may be a variable resistance oxide of a metal, and the conductive filaments may be the metal. Related devices are also disclosed.
申请公布号 US7883929(B2) 申请公布日期 2011.02.08
申请号 US20080035169 申请日期 2008.02.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI BYUNG-YONG;LEE CHOONG-HO;PARK KYU-CHARN
分类号 H01L31/00 主分类号 H01L31/00
代理机构 代理人
主权项
地址