发明名称 Integrated circuit, system and method including a performance test mode
摘要 An integrated circuit includes N configurable cells each including one functional input, one output, one propagation input and one output. The circuit includes a functional mode in which the N configurable cells are coupled by their functional input and their output to logic blocks with which they cooperate to form at least one logic circuit. The disclosed circuit also includes a test mode in which the N configurable cells are coupled by their propagation input and their output to the logic blocks and in which the output of the Nth configurable cell is coupled to a functional input of the first logic block to form an oscillator.
申请公布号 US7884635(B2) 申请公布日期 2011.02.08
申请号 US20080033483 申请日期 2008.02.19
申请人 STMICROELECTRONICS, SA 发明人 BOROT BERTRAND;BECHET EMMANUEL
分类号 H03K19/00 主分类号 H03K19/00
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