发明名称 X-RAY EXAMINATION DEVICE AND METHOD
摘要 <p>The present invention relates to an X-ray examination device and a corresponding method. A fast and periodical modulation of the X-ray flux within each detection interval is performed having a low X-ray flux at the beginning of the detection interval to ensure that no detection channel is overloaded. With increasing the X-ray flux particularly the peripheral detection channels will run into saturation, which is detected. A saturated detector channel is stopped from further detecting radiation, and the time of effective radiation detection without saturation is measured for correcting those detection signals. From all detection signals, after any correction of detection signals from saturated detection channels, an X-ray image can be reconstructed.</p>
申请公布号 WO2011013031(A1) 申请公布日期 2011.02.03
申请号 WO2010IB53304 申请日期 2010.07.20
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;PROKSA, ROLAND 发明人 PROKSA, ROLAND
分类号 A61B6/03;G01T1/06 主分类号 A61B6/03
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