发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To make precise process calibration for a short time without increasing a circuit area required for a process monitor. <P>SOLUTION: After a digital control oscillator 38 selects an arbitrary oscillation band, a control section 25 switches a switch 44 for a signal of a TDC 41 to be inputted to a process monitor control section 40. The TDC 41 converts a period between a rising edge of a signal VREF and a rising edge of the signal VPRE, closest to it, to a digital value, and a period between a rising edge of the signal VREF and a rising edge of the signal VPRE, second closest to it, to another digital value, and calculates a difference between the digital values. The process monitor control section 40 refers to a look-up table, and compares the calculated value with a preset expected value to determine a process value. The process values are outputted, respectively, to an adjustment control section 26 as a process signal, to perform process calibration. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011023938(A) 申请公布日期 2011.02.03
申请号 JP20090166590 申请日期 2009.07.15
申请人 RENESAS ELECTRONICS CORP 发明人 UOZUMI TOSHIYA;UEDA KEISUKE;SHINPO JIRO
分类号 H04B1/40;H01L21/822;H01L27/04;H03K3/02;H03K5/26;H03L7/081;H03L7/087;H03L7/099 主分类号 H04B1/40
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