发明名称 SEMICONDUCTOR EXPOSURE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem that a phenomenon of printing of a pattern, arranged outside an exposure region of a photo-reticle, on a wafer due to stray light occurs. <P>SOLUTION: A first masking blade for exposing only a desired pattern on a reticle by an exposure device is installed above a reticle stage, and a second masking blade is installed below the reticle stage to prevent light transmitted in a non-exposure region on the reticle from entering a projection lens owing to stray light. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011023471(A) 申请公布日期 2011.02.03
申请号 JP20090165839 申请日期 2009.07.14
申请人 SEIKO INSTRUMENTS INC 发明人 FUJIMURA TAKASHI
分类号 H01L21/027 主分类号 H01L21/027
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