| 摘要 |
Enhanced electrostatic discharge (“ESD”) protection for an integrated circuit is described. An embodiment relates generally to a circuit for protection against ESD. The circuit has an input/output node and a driver. The driver has a first transistor and a second transistor. A first source/drain node of the first transistor is coupled to the input/output node. A second source/drain node of the first transistor forms a first interior node capable of accumulating charge when electrically floating. A first current flow control circuit is coupled to a discharge node and the second source/drain node of the first transistor. The first current flow control circuit is electrically oriented in a bias direction for allowing accumulated charge to discharge from the first interior node via the first current flow control circuit to the discharge node.
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