发明名称 |
FINE-STRUCTURE MANUFACTURING METHOD |
摘要 |
<p>Provided is a fine-structure manufacturing method that enables making deep and thin fine-structures on GaN-type semiconductors, with precision. The fine-structure manufacturing method is a method for forming fine structures on semiconductors, and is configured to be provided with: a first process wherein a first GaN-type semiconductor layer is formed on a substrate; a second process wherein a first pore is formed on the aforementioned first GaN-type semiconductor layer that was formed in the aforementioned first process, using etching; and a third process wherein heat treatment is conducted, in an gas atmosphere containing nitrogen, and with a temperature of not less than 850°C and not more than 950°C, to form a second pore that is made by having the diameter of the aforementioned first pore, formed in the aforementioned second process, made to be narrower in the in-plane direction of the aforementioned substrate.</p> |
申请公布号 |
WO2011013363(A1) |
申请公布日期 |
2011.02.03 |
申请号 |
WO2010JP04783 |
申请日期 |
2010.07.28 |
申请人 |
CANON KABUSHIKI KAISHA;KAWASHIMA, TAKESHI;HOSHINO, KATSUYUKI;KAWASHIMA, SHOICHI;NAGATOMO, YASUHIRO |
发明人 |
KAWASHIMA, TAKESHI;HOSHINO, KATSUYUKI;KAWASHIMA, SHOICHI;NAGATOMO, YASUHIRO |
分类号 |
H01S5/183;H01L21/3065 |
主分类号 |
H01S5/183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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