发明名称 STRUCTURE TO IMPROVE RELIABILITY OF LEAD-FREE C4 INTERCONNECTION AND METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a structure of a control collapse chip connection (C4) and its manufacturing method, and particularly, a structure to improve reliability of lead-free C4 interconnection and its method. <P>SOLUTION: The structure includes a ball limited metalization (BLM) layer and a solder ball of control collapse chip connection (C4) formed on the BLM layer. Moreover, the structure includes the final metal pad layer under the BLM layer and a cap layer under the final metal pad layer. Then the structure includes an air gap between the final metal pad layer and one of the BLM layer and cap layer under the C4 solder ball. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011023719(A) 申请公布日期 2011.02.03
申请号 JP20100157590 申请日期 2010.07.12
申请人 INTERNATL BUSINESS MACH CORP 发明人 DAUBENSPECK TIMOTHY HARRISON;GAMBINO JEFFREY P;SAUTER WOLFGANG;MUZZY CHRISTOPHER DAVID;QUESTAD DAVID L;SULLIVAN TIMOTHY DOOLING;PAUL FORTIER
分类号 H01L21/60 主分类号 H01L21/60
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