MICROSCOPY DEVICE WITH TUNING FORK AND RECTILINEAR TIP

摘要

The device has a tuning fork and a rectilinear tip attached to one tine of the fork, a surface for supporting objects to be analysed and means for holding and moving the fork, said means being positioned so that the tip is inclined with respect to the support surface, at an angle that enables exploration with a rectilinear tip without the fork coming into contact with the objects or the liquid in which said object may be submerged, at the same time allowing visual access to the position of the end of the rectilinear tip from above said support surface, and makes it possible to use a plurality of tuning fork/tip assemblies, thereby enabling simultaneous measurement of several physical parameters of the surface of the object.