摘要 |
A circuit arrangement (10) for testing a reset circuit (11) comprises the reset circuit (11) and a changeover switch (14). The reset circuit comprises a voltage input (12) for feeding an input voltage (VDD) and an output (13) for providing a reset signal (POR) as a function of the input voltage (VDD). The changeover switch (14) comprises a first input (15) for feeding a test voltage (VTM), a second input (16) for feeding a supply voltage (VBAT), a control input (17) for changing over between the first and the second input (15, 16) as a function of the test signal (TM), and an output (18) that is coupled to the voltage input (12) of the reset circuit (11).
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