发明名称 CANTILEVER HAVING INCLINATION CORRECTION PROBE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a cantilever of which probe can vertically approach a sample surface and which is especially suitable for observations and measurements of a structure having large irregularities and a deep groove structure and to provide a method for manufacturing the same. SOLUTION: The cantilever including both of a needle-like diamond formed on a diamond substrate through the use of thermochemical processing and a probe including a flat plate part provided integrally with the needle-like diamond includes a second needle-like diamond prepared by partially removing a side surface of the needle-like diamond. The second needle-like diamond is processed in such a way as to have an angleθof inclination, a mounting angle of the cantilever, to a line perpendicularly extending from a probe mounting surface of the cantilever. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011022010(A) 申请公布日期 2011.02.03
申请号 JP20090167381 申请日期 2009.07.16
申请人 NAMIKI PRECISION JEWEL CO LTD 发明人 KOYAMA KOJI
分类号 G01Q60/38;G01Q70/10;G01Q70/14;G01Q70/16 主分类号 G01Q60/38
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