发明名称 POLISHING LIQUID FOR CMP AND POLISHING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polishing liquid and a polishing method which maintain fine polishing speed for a barrier metal of a barrier layer and achieve high polishing speed for a silicon dioxide making up a cap layer and low-polishing speed for a low-k film. <P>SOLUTION: The polishing liquid for CMP contains abrasive grains, a metal oxide solubilizer, an oxidizing agent, water and a class-4 phosphonium salt. The abrasive grains have a positive zeta potential in the polishing liquid, and the class-4 phosphonium salt has an alkyl triphenyl phosphonium salt structure. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011023448(A) 申请公布日期 2011.02.03
申请号 JP20090165424 申请日期 2009.07.14
申请人 HITACHI CHEM CO LTD 发明人 TANAKA TAKAAKI;MISHIMA KOJI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
代理机构 代理人
主权项
地址