发明名称 Charged particle beam irradiation system and method of extracting charged particle beam
摘要 <p>A charged particle beam irradiation system includes an accelerator for accelerating a charged particle beam, a beam irradiation apparatus having a beam energy modulator and arranged for irradiating an object with the charged particle beam extracted from the accelerator and having passed the beam energy modulator, which is rotated and whose thickness in the axial direction differs in the rotational direction, and a controller for controlling the extraction intensity of the charged particle beam extracted from the accelerator, while the charged particle beam is being extracted, on the basis of the rotational angle of the beam energy modulator. </p>
申请公布号 EP1763293(A3) 申请公布日期 2011.02.02
申请号 EP20060018569 申请日期 2006.09.05
申请人 HITACHI, LTD. 发明人 FUJIMAKI, HISATAKA;TOTAKE, SATOSHI
分类号 H05H7/10;A61N5/00;G21K1/10 主分类号 H05H7/10
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