发明名称 Method of manufacturing a semiconductor device including a semiconductor substrate with stripes of different crystal plane directions
摘要 Manufacturing a semiconductor device with higher operating characteristics and achieve low power consumption of a semiconductor integrated circuit. A single crystal semiconductor layer is formed so that crystal plane directions of single crystal semiconductor layers which are used for channel regions of an n-channel TFT and a p-channel TFT and which are formed over the same plane of the substrate are the most appropriate crystal plane directions for each TFT. In accordance with such a structure, mobility of carrier flowing through a channel is increased and the semiconductor device with higher operating characteristics can be provided. Low voltage driving can be performed, and low power consumption can be achieved.
申请公布号 US7879689(B2) 申请公布日期 2011.02.01
申请号 US20080273010 申请日期 2008.11.18
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MORIWAKA TOMOAKI
分类号 H01L21/301;H01L21/461;H01L21/84;H01L27/12 主分类号 H01L21/301
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