发明名称 |
Timing and signal integrity analysis of integrated circuits with semiconductor process variations |
摘要 |
In one embodiment of the invention, a method of statically analyzing an integrated circuit with process and environment variations is provided. The method includes characterizing each circuit cell of a cell library for a sensitivity to process parameter variations within a predetermined range; creating a timing graph corresponding to a netlist representing an integrated circuit design; along nodes of the timing graph, computing delay values including sensitivities to process variations; for each selected output node of the netlist, propagating a full timing value function with the sensitivities to the selected output nodes; and generating a parameterized timing report including the sensitivities to the process variations.
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申请公布号 |
US7882471(B1) |
申请公布日期 |
2011.02.01 |
申请号 |
US20060560261 |
申请日期 |
2006.11.15 |
申请人 |
CADENCE DESIGN SYSTEMS, INC. |
发明人 |
KARIAT VINOD;PHILLIPS JOEL R.;KELLER IGOR |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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