发明名称 Method for quartz photomask plasma etching
摘要 A method for etching quartz is provided herein. In one embodiment, a method of etching quartz includes providing a filmstack in an etching chamber, the filmstack having a quartz layer partially exposed through a patterned layer, providing at least one fluorocarbon process gas to a processing chamber, biasing a quartz layer disposed on a substrate support in the processing chamber with a plurality of power pulses less than 600 Watts and etching the quartz layer through a patterned mask. The method for etching quartz described herein is particularly suitable for fabricating photomasks having etched quartz portions.
申请公布号 US7879510(B2) 申请公布日期 2011.02.01
申请号 US20050031885 申请日期 2005.01.08
申请人 APPLIED MATERIALS, INC. 发明人 ANDERSON SCOTT ALAN;KUMAR AJAY
分类号 G03F1/00 主分类号 G03F1/00
代理机构 代理人
主权项
地址