发明名称 |
Method and apparatus for measuring and compensating for static phase error in phase locked loops |
摘要 |
A method and circuit for static phase error measurement includes a reference clock delay chain having a selectable number of delay elements. A number of the delay elements are enabled in accordance with a select length signal to delay a reference clock signal. A feedback signal delay chain also has a selectable number of delay elements. A number of the delay elements are enabled in accordance with a select length signal to delay a feedback signal. A latch tests phase alignment between the delayed reference clock signal and the delayed feedback signal and outputs a measurement of static phase error.
|
申请公布号 |
US7880518(B2) |
申请公布日期 |
2011.02.01 |
申请号 |
US20090543284 |
申请日期 |
2009.08.18 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
JENKINS KEITH AELWYN |
分类号 |
H03L7/06 |
主分类号 |
H03L7/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|