发明名称 Methods and systems for removing offset bias in chemical array data
摘要 Methods, systems and computer readable media for quantifying and removing offset bias signals in a chemical array data set having one or more channels. In one embodiment, for each channel of data in the data set, a first set of features is selected from the data set. Surface intensities are calculated for features in the first selected set of features and surface intensities of features not in the first selected set are calculated from the calculated surface intensities. A second set of features is selected, the intensity values of which are within a range of correspondingly located surface intensity values defined by upper and lower threshold intensities. Secondary surface intensities are calculated for features in the second selected set of features and secondary surface intensities for all other locations on the array that were not locations corresponding to the features having secondary surface intensities calculated therefore, are calculated. Feature intensities of the channel features are then corrected as a function of the secondary surface intensities.
申请公布号 US7881876(B2) 申请公布日期 2011.02.01
申请号 US20060580744 申请日期 2006.10.12
申请人 AGILENT TECHNOLOGIES, INC. 发明人 LE COCQ CHRISTIAN A.;DELENSTARR GLENDA C.;CORSON JOHN F.
分类号 G06F7/00 主分类号 G06F7/00
代理机构 代理人
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