| 摘要 |
The invention relates to a device for analysing the topography of a surface (2) of a substrate (1) travelling on a substantially planar course with axis X, in which the axis X defines with the axes Y and Z an orthonormal frame of reference of the space in which the surface (2) is substantially parallel to the plane XY, said device including a means (10) for structured lighting of said surface (2) suitable for engaging with a means (20) for measuring the light backscattered by said surface (2) in order to analyse the topography of said surface (2) during the travel of said substrate (1), the structured lighting means (10) being capable of projecting a light beam (F) with an angle of incidence 'a' onto the surface (2), such as to form a plurality 'n' of luminous streaks (S1, S2,... Sn) thereon, each luminous streak (S) forming an angle 'b' with the axis X1; device in which the measurement means (20) comprises a linear camera located in a plane P secant to the plane XY and the plane XZ, the intersection of the plane P with the plane XY forming an angle 'c' with the axis Y, the intersection of the plane P with the plane XZ forming an angle 'e' with the axis Z; device in which the angle of incidence 'a' is between 30° and 70°, the angle 'b' is between -45° and +45°, the angle 'c' is between -30° and +30° and the angle 'e' is between -45° and +45°. |
