发明名称 INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus for inspecting a ghost by using an actual optical system.SOLUTION: Since the ghost is inspected while a light emitting diode LED and an aperture AP are moved in a matrix in the X-axis and Y-axis directions and an imaging element CCD is moved in the Z-axis direction, relative positions of the light emitting diode LED, the aperture AP and the imaging element CCD to the optical system OPS for generating the ghost are obtained.
申请公布号 JP2011017636(A) 申请公布日期 2011.01.27
申请号 JP20090162835 申请日期 2009.07.09
申请人 KONICA MINOLTA OPTO INC 发明人 SOWA SEIJI
分类号 G01M11/00;G01N21/84 主分类号 G01M11/00
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