发明名称 WET ETCHING SYSTEM AND PATTERNING METHOD FOR COPPER-CONTAINING MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a wet etching system and a patterning method which can form a fine circuit pattern without causing a failure in the shape (while maintaining particularly the width of an upper part of circuit wiring).SOLUTION: The wet etching system includes: an exposure means for exposing a copper-containing material having a surface on which a pattern of a positive type photosensitive resist has been formed, to light; and a wet etching means for wet-etching the copper-containing material exposed to light by the exposure means. The method for patterning the copper-containing material includes: exposing the copper-containing material having the surface on which the pattern of the positive type photosensitive resist has been formed, to light; and wet-etching the exposed material by using an etchant composition formed of an aqueous solution which includes: (A) 0.1-15 mass% of at least one oxidizing agent component selected from a cupric ion and a ferric ion; and (B) 0.001-5 mass% of a compound that has been prepared by adding at least one selected from ethylene oxide and propylene oxide to active hydrogen of a (poly)amine compound.
申请公布号 JP2011017052(A) 申请公布日期 2011.01.27
申请号 JP20090162713 申请日期 2009.07.09
申请人 ADEKA CORP 发明人 NAKAMURA YUSUKE
分类号 C23F1/18;C23F1/00;H05K3/06 主分类号 C23F1/18
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