发明名称 INSPECTION METHOD OF SUBSTRATE ASSEMBLY
摘要 PURPOSE: An inspecting method is provided to improve efficiency in the aspect of productivity by selecting inferior product through an align inspection process capable of remarkably reducing inspection time than an indentation impression inspection process. CONSTITUTION: A substrate assembly(10) is loaded in a first inspection table(50) and a second inspection table(60). An indentation impression inspection process is executed for the substrate assembly which is loaded to the first inspection table. An align inspection process is executed for the substrate assembly which is loaded to the second inspection table. The indentation impression inspection process for the substrate assembly of the first inspection table and a line inspection process for the substrate assembly of the second inspection table are simultaneously executed. The align inspection process uses an align camera(61).
申请公布号 KR20110008726(A) 申请公布日期 2011.01.27
申请号 KR20090066214 申请日期 2009.07.21
申请人 ANI. CO., LTD. 发明人 KIM, JI HYOUNG;PARK, JAE SUNG;KIM, TAE YOUNG;JEON, DONG CHUL
分类号 H05K13/08;G01B11/24 主分类号 H05K13/08
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