发明名称 Shield Contacts in a Shielded Gate MOSFET
摘要 A semiconductor structure comprises an active region comprising trenches extending into a semiconductor region. Each trench includes a shield electrode and a gate electrode. The semiconductor structure also comprises a shield contact region adjacent to the active region. The shield contact region comprises at least one contact trench extending into the semiconductor region. The shield electrode from at least one of the trenches in the active region extends along a length of the contact trench. The semiconductor structure also comprises an interconnect layer extending over the active region and the shield contact region. In the active region the interconnect layer is isolated from the gate electrode in each trench by a dielectric layer and contacts mesa surfaces of the semiconductor region adjacent to the trenches. In the shield contact region the interconnect layer contacts the shield electrode and the mesa surfaces of the semiconductor region adjacent to the contact trench.
申请公布号 US2011018059(A1) 申请公布日期 2011.01.27
申请号 US20090509379 申请日期 2009.07.24
申请人 DUNN DIXIE;THORUP PAUL;PROBST DEAN E;GRUENHAGEN MICHAEL D 发明人 DUNN DIXIE;THORUP PAUL;PROBST DEAN E.;GRUENHAGEN MICHAEL D.
分类号 H01L29/78;H01L21/28 主分类号 H01L29/78
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