发明名称 SURFACE INSPECTION DEVICE AND OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a surface inspection device capable of preventing deterioration in the quantity of light to be detected.SOLUTION: The surface inspection device includes a light source section for emitting at least heat rays and ultraviolet radiation; an illumination section for irradiating the surface of a substrate to be inspected, having a prescribed repeated pattern with a linearly polarized light using the ultraviolet radiation; a detection section for detecting a polarized light component whose vibration direction crosses the linearly polarized light in the light reflected from the surface of the substrate to be inspected irradiated with the linearly polarized light; and an inspection section for inspecting the existence or the non-existence of defects, based on the polarized light component detected by the detection section. A polarizing plate 34 for acquiring the linearly polarized light or the polarized light component is disposed by a sealing member 36, on the optical path of the illumination section or the inspection section. Also, an ultraviolet light transmitting heat-ray absorbing film is formed on the surface of a transmission region of the ultraviolet radiation of the sealing member 36, and one of a heat-ray absorbing film, a laminated film of a heat ray reflection film and the heat ray absorption film, a laminated film of a thermally conductive film and the heat-ray absorbing film, and a laminated film of the heat-ray reflecting film and the thermally conductive film is formed at a peripheral region of the transmission region.
申请公布号 JP2011017538(A) 申请公布日期 2011.01.27
申请号 JP20090160355 申请日期 2009.07.07
申请人 NIKON CORP 发明人 INOUE TAKESHI;YAMADA MASAYUKI
分类号 G01N21/956;H01L21/66 主分类号 G01N21/956
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