发明名称 OPTICAL WAVELENGTH-MEASURING INSTRUMENT, OPTICAL PARAMETRIC OSCILLATION DEVICE PROVIDED WITH THE SAME AND OPTICAL WAVELENGTH-MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optical wavelength-measuring instrument which is capable of measuring wavelength of idler light and is low-cost; to provide an optical parametric oscillator provided with the optical wavelength-measuring instrument; and to provide an optical wavelength-measuring method.SOLUTION: The optical wavelength-measuring instrument 1 includes: a measurement part 3 having a nonlinear optical crystal 11 which makes pump light generated on the basis of excitation light outputted from an excitation light source incident and generates signal light having a wavelength different from the pump light and idler light, and capable of measuring wavelengths in the wavelength region from visible light ray to near infrared ray among laser beams emitted to the outer side from an optical parametric oscillator 2 which performs wavelength conversation of laser beams; and a calculation part 4 which calculates wavelengths of the pump light and the signal light on the basis of the measurement result of wavelength of a second harmonic wave of the pump light and wavelength of sum frequency light of the pump light and signal light, obtained by the measurement part 3 and calculates wavelength of the idler light on the basis of the calculation result. Further, the optical parametric oscillation device includes the optical wavelength-measuring instrument 1 and the optical parametric oscillator 2.
申请公布号 JP2011017911(A) 申请公布日期 2011.01.27
申请号 JP20090162669 申请日期 2009.07.09
申请人 NIPPON SIGNAL CO LTD:THE 发明人 SANNOMIYA HAJIME
分类号 G02F1/39 主分类号 G02F1/39
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