发明名称 Method of producing semiconductor device, solid-state imaging device, method of producing electric apparatus, and electric apparatus
摘要 There is provided a method of producing a semiconductor device. The method includes the steps of: forming a first hard mask having an opening above a substrate; forming a sacrificial film above a side surface of the opening of the first hard mask; forming a second hard mask in the opening having the sacrificial film above the side surface; removing the sacrificial film after the second hard mask is formed; ion implanting a first conductivity-type impurity through the first hard mask; and ion implanting a second conductivity-type impurity through the first and second hard masks.
申请公布号 US2011018083(A1) 申请公布日期 2011.01.27
申请号 US20100923584 申请日期 2010.09.29
申请人 SONY CORPORATION 发明人 MIYOSHI YASUFUMI
分类号 H01L31/0232;H01L31/02 主分类号 H01L31/0232
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