发明名称 BIAS-CONTROLLED DEEP TRENCH SUBSTRATE NOISE ISOLATION INTEGRATED CIRCUIT DEVICE STRUCTURES
摘要 A novel and useful apparatus for and method of providing noise isolation between integrated circuit devices on a semiconductor chip. The invention addresses the problem of noise generated by digital switching devices in an integrated circuit chip that may couple through the silicon substrate into sensitive analog circuits (e.g., PLLs, transceivers, ADCs, etc.) causing a significant degradation in performance of the sensitive analog circuits. The invention utilizes a deep trench capacitor (DTCAP) device connected to ground to isolate victim circuits from aggressor noise sources on the same integrated circuit chip. The deep penetration of the capacitor creates a grounded shield deep in the substrate as compared with other prior art shielding techniques
申请公布号 US2011018094(A1) 申请公布日期 2011.01.27
申请号 US20090506270 申请日期 2009.07.21
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHAPMAN PHILLIP FRANCIS;GOREN DAVID;KRISHNASAMY RAJENDRAN;SHEINMAN BENNY;SHLAFMAN SHLOMO;SINGH RAMINDERPAL;WOODS WAYNE H.
分类号 H01L29/92;G06F17/50;H01L21/02 主分类号 H01L29/92
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