APPARATUS FOR THE ABSOLUTE MEASUREMENT OF TWO DIMENSIONAL OPTICAL PATH DISTRIBUTIONS USING INTERFEROMETRY
摘要
<p>An apparatus for the absolute measurement of a two dimensional optical path distribution comprising: a light source (4) for illuminating an object (26) with light having a plurality of wavelengths: an interferometer (12) for forming an image of at least part of the object, which image comprises a broad band interferogram; a hyperspectral imager (30) in optical communication with the interferometer for spectrally separating the broad band interferogram into a plurality of narrow band two dimensional interf erograms (72, 74, 76); a register (38) for spatially registering the narrow band interf erograms; an extractor for extracting one dimensional intensity signals from corresponding pixels in each narrow band interferogram; and a calculator (100) for calculating the frequency for each point on the object from a one dimensional intensity signal associated with that point.</p>
申请公布号
WO2011010092(A1)
申请公布日期
2011.01.27
申请号
WO2010GB01379
申请日期
2010.07.20
申请人
LOUGHBOROUGH UNIVERSITY;HUNTLEY, JONATHAN MARK;RUIZ, PABLO DANIEL;WIDJANARKO, TAUFIQ
发明人
HUNTLEY, JONATHAN MARK;RUIZ, PABLO DANIEL;WIDJANARKO, TAUFIQ