发明名称 SURFACE INSPECTION DEVICE AND OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a surface inspection device capable of preventing deterioration in the quantity of light to be detected.SOLUTION: The surface inspection device 1 includes a light source section for emitting at least heat rays and ultraviolet radiation; an illumination section for irradiating the surface of a substrate to be inspected having a prescribed repetition pattern with linearly polarized light using the ultraviolet radiation; a detection section for detecting a polarized light component whose vibration direction crosses the linearly polarized light in reflected light from the surface of the substrate to be inspected irradiated with the linearly polarized light; and an inspection section for inspecting the existence or the non-existence defects by the repeated pattern, based on the polarized light component detected by the detection section. A polarizing plate 34 for acquiring the linearly polarized light or the polarized light component is disposed in a state of being sealed, to the outside air by a sealing member 36 on an optical path of the illumination section or the inspection section. Also, an ultraviolet light transmitting heat-ray absorbing film is formed on the surface of a transmission region of the ultraviolet radiation of the sealing member 36.
申请公布号 JP2011017539(A) 申请公布日期 2011.01.27
申请号 JP20090160356 申请日期 2009.07.07
申请人 NIKON CORP 发明人 INOUE TAKESHI;YAMADA MASAYUKI
分类号 G01N21/956;G01B11/24;H01L21/66 主分类号 G01N21/956
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