发明名称 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
摘要 A wafer is disposed in a chamber, a plasma generating space is formed in the chamber, plasma processing is performed to the front surface of the processing object while keeping at least the front surface of the processing object in contact with the plasma generating space. The plasma processing is performed with the plasma generating space being kept in contact with at least the peripheral region of the back surface of the processing object.
申请公布号 US2011017706(A1) 申请公布日期 2011.01.27
申请号 US20080668106 申请日期 2008.07.10
申请人 TOKYO ELECTRON LIMITED 发明人 TAKAHASHI TETSURO;FUJINO YUTAKA;TOSHIMA HIROYUKI;KUBO ATSUSHI;KANG SONG YUN;VENTZEK PETER;SEGAWA SUMIE
分类号 C23F1/08;C23C16/00;C23C16/50;C23C16/511;C23F1/00 主分类号 C23F1/08
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