发明名称 Semiconductor having optimized insulation structure and process for producing the semiconductor
摘要 A semiconductor having an optimized insulation structure which is simple and inexpensive to produce and can be made smaller than LOCOS insulation structures is disclosed. An implantation mask on a surface of a semiconductor substrate is used to implant elements into the semiconductor substrate, which elements, on thermal activation, form an insulation region together with the further elements of the semiconductor substrate. The thermal activation is effected by means of laser irradiation, during which the semiconductor substrate is briefly melted and then recrystallizes during the subsequent cooling, so that the implanted elements form the insulation region together with the further elements of the semiconductor substrate.
申请公布号 US7875560(B2) 申请公布日期 2011.01.25
申请号 US20060392363 申请日期 2006.03.29
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 ZUNDEL MARKUS;KRISCHKE NORBERT
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
代理机构 代理人
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