FOCUSED ION BEAM APPARATUS USING OPENING FEATURE AND MACHINING METHOD USING THEREOF,申请号KR20080063469-传众专利搜索

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发明名称	FOCUSED ION BEAM APPARATUS USING OPENING FEATURE AND MACHINING METHOD USING THEREOF
摘要
申请公布号	KR101010924(B1)	申请公布日期	2011.01.25
申请号	KR20080063469	申请日期	2008.07.01
申请人		发明人
分类号	B23K15/08;B23K15/00;H01J37/30	主分类号	B23K15/08
代理机构		代理人
主权项
地址

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