发明名称 METHOD OF FORMING A MAGNETIC TUNNEL JUNCTION USING A SINGLE MASK
摘要 <p>A method for integrating a magnetic tunnel junction (MTJ) device into an integrated circuit includes providing in a semiconductor back-end-of-line (BEOL) process flow a substrate having a first interlevel dielectric layer and at least a first metal interconnect. Over the first interlevel dielectric layer and the first metal interconnect, magnetic tunnel junction material layers are deposited. From the material layers a magnetic tunnel junction stack, coupled to the first metal interconnect, is defined using a single mask process. The magnetic tunnel junction stack is integrated into the integrated circuit.</p>
申请公布号 KR20110007210(A) 申请公布日期 2011.01.21
申请号 KR20107025983 申请日期 2009.04.16
申请人 QUALCOMM INCORPORATED 发明人 KANG, SEUNG H.;BANG DAVID;LEE, KANG HO
分类号 H01L27/115;H01L21/8247;H01L27/22;H01L43/00 主分类号 H01L27/115
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