发明名称 |
METHOD OF FORMING A MAGNETIC TUNNEL JUNCTION USING A SINGLE MASK |
摘要 |
<p>A method for integrating a magnetic tunnel junction (MTJ) device into an integrated circuit includes providing in a semiconductor back-end-of-line (BEOL) process flow a substrate having a first interlevel dielectric layer and at least a first metal interconnect. Over the first interlevel dielectric layer and the first metal interconnect, magnetic tunnel junction material layers are deposited. From the material layers a magnetic tunnel junction stack, coupled to the first metal interconnect, is defined using a single mask process. The magnetic tunnel junction stack is integrated into the integrated circuit.</p> |
申请公布号 |
KR20110007210(A) |
申请公布日期 |
2011.01.21 |
申请号 |
KR20107025983 |
申请日期 |
2009.04.16 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
KANG, SEUNG H.;BANG DAVID;LEE, KANG HO |
分类号 |
H01L27/115;H01L21/8247;H01L27/22;H01L43/00 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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