发明名称 Structure and Method for Screening SRAMS
摘要 An integrated circuit containing an SRAM that provides a switch to decouple the SRAM wordline voltage from the SRAM array voltage during screening and that also provides different wordline and array voltages during a portion of the SRAM bit screening test. A method for screening SRAM bits in an SRAM array in which the wordline voltage is different than the array voltage during a portion of the screening test.
申请公布号 US2011013470(A1) 申请公布日期 2011.01.20
申请号 US20090502879 申请日期 2009.07.14
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 HOUSTON THEODORE W.;DENG XIAOWEI
分类号 G11C29/00;G11C8/08 主分类号 G11C29/00
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