发明名称 |
Structure and Method for Screening SRAMS |
摘要 |
An integrated circuit containing an SRAM that provides a switch to decouple the SRAM wordline voltage from the SRAM array voltage during screening and that also provides different wordline and array voltages during a portion of the SRAM bit screening test. A method for screening SRAM bits in an SRAM array in which the wordline voltage is different than the array voltage during a portion of the screening test.
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申请公布号 |
US2011013470(A1) |
申请公布日期 |
2011.01.20 |
申请号 |
US20090502879 |
申请日期 |
2009.07.14 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HOUSTON THEODORE W.;DENG XIAOWEI |
分类号 |
G11C29/00;G11C8/08 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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