发明名称 LASER DIODE TESTING METHOD
摘要 An apparatus and method for verifying a laser etch on a rubber sample. In one embodiment, the apparatus includes a tire production line, a sample holding device, a laser having a diode, and a servo-assembly. The laser of the apparatus is configured to etch indicia on a sidewall of a tire on the tire production line and is further configured to etch at least one line in a rubber sample on the sample holding device. In one embodiment, the method includes etching a production tire with a laser, interrupting the laser, moving the laser to a laser diode testing location, loading a rubber sample in a holding device, etching at least one line into the rubber sample with the laser, manually or automatically measuring a depth of the at least one line, and comparing the depth of the at least one line to an acceptable line depth range.
申请公布号 US2011013177(A1) 申请公布日期 2011.01.20
申请号 US20090504115 申请日期 2009.07.16
申请人 BRIDGESTONE AMERICAS TIRE OPERATIIONS, LLC 发明人 CRIM J. DANIEL
分类号 G01J1/00 主分类号 G01J1/00
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