GENERATION METHOD OF SCAN CHAIN, GENERATION PROGRAM OF THE SCAN CHAIN, AND INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To generate a scan chain so that tests between a plurality of domains obtained by dividing one circuit are performed, relative to the test of an integrated circuit.SOLUTION: If a power consumption when operating a scan shift including a plurality of flip-flops exceeds an allowable value during the test of the integrated circuit, the plurality of flip-flops included in the scan chain are divided into a plurality of groups. In dividing, partial flip-flops in the plurality of flip-flops are included in a plurality of groups based on a transmission route of a signal when the integrated circuit is operated actually. The flip-flops included in the plurality of groups are connected to each scan chain generated in each of the plurality of groups.