| 摘要 |
PROBLEM TO BE SOLVED: To efficiently exclude an initial defect.SOLUTION: A semiconductor integrated circuit device includes: terminals 11a and 11m; first to (2n+1)th resistive elements ((n) is an integer of at least 1) (resistive element group 12) connected in series between the terminals 11a and 11m; a selection circuit 14 selecting, assuming that a terminal 11a connected to one end of the first resistive element is a 0th node, a terminal 11m connected to the other end of the (2n+1)th resistive element is a (2n+1)th node, and a connection point of the other end of an (i)th resistive element ((i) is an integer from 1 to 2n) and one end of an (i+1)th resistive element is an (i)th node, any one of the 0th to (2n+1)th nodes and outputting a voltage applied to the selected node; a switch group 15a which can short-circuit any (2k)th node ((k) is an integer from 0 to n); and a switch group 15b which can short-circuit any (2k+1)th node. The (2k)th and (2k+1)th nodes are all short-circuited, and subsequently, a predetermined voltage is temporarily applied between the terminals 11a and 11m. |
