发明名称 AFFECTED LAYER DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide an affected layer detector precisely detecting an affected layer of a workpiece.SOLUTION: The affected layer detector is equipped with: a sensor 10 that has a sensor head 12 having detection width W2 smaller than width W1 of an inspection surface of a workpiece 2 and outputs a signal according to the modified layer on the inspection surface; moving means 15a, 20 for relatively moving the workpiece 2 and the sensor 10 so that the sensor head 12 performs a plurality of inspections to the inspection surface; a display attribute storage means 31 for storing a display attribute according to an output signal of the sensor 10; and a display means 30 for displaying an affected layer distribution map corresponding to the inspection surface, based on the output signal by the sensor 10 and the display attribute.
申请公布号 JP2011013147(A) 申请公布日期 2011.01.20
申请号 JP20090158848 申请日期 2009.07.03
申请人 JTEKT CORP 发明人 AZUMA TAKAYUKI;SOMA SHINJI
分类号 G01N27/90 主分类号 G01N27/90
代理机构 代理人
主权项
地址