发明名称 |
POSITIVE TYPE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN USING THE SAME, AND FLUORINE-CONTAINED HIGH MOLECULAR COMPOUND |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition preferable for immersion exposure or alkali development, and also to provide a method of forming a resist pattern using the resist composition, and a fluorine-contained high molecular compound useful as an additive used in the resist composition.SOLUTION: This positive type resist composition contains: a fluorine-contained high molecular compound (F) containing a structural unit (f1) having decomposition property to an alkali liquid developer as a block copolymerization part ; a base material component (A) increased in solubility to the alkali liquid developer by action of acid; and an acid generating agent component (B) adapted to generate an acid by exposure. |
申请公布号 |
JP2011013569(A) |
申请公布日期 |
2011.01.20 |
申请号 |
JP20090159073 |
申请日期 |
2009.07.03 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
MATSUMIYA YU;SHIONO HIROHISA;HIRANO TOMOYUKI;DAZAI NAOHIRO |
分类号 |
G03F7/039;C08F297/00;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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