发明名称 POSITIVE TYPE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN USING THE SAME, AND FLUORINE-CONTAINED HIGH MOLECULAR COMPOUND
摘要 PROBLEM TO BE SOLVED: To provide a resist composition preferable for immersion exposure or alkali development, and also to provide a method of forming a resist pattern using the resist composition, and a fluorine-contained high molecular compound useful as an additive used in the resist composition.SOLUTION: This positive type resist composition contains: a fluorine-contained high molecular compound (F) containing a structural unit (f1) having decomposition property to an alkali liquid developer as a block copolymerization part ; a base material component (A) increased in solubility to the alkali liquid developer by action of acid; and an acid generating agent component (B) adapted to generate an acid by exposure.
申请公布号 JP2011013569(A) 申请公布日期 2011.01.20
申请号 JP20090159073 申请日期 2009.07.03
申请人 TOKYO OHKA KOGYO CO LTD 发明人 MATSUMIYA YU;SHIONO HIROHISA;HIRANO TOMOYUKI;DAZAI NAOHIRO
分类号 G03F7/039;C08F297/00;G03F7/004;H01L21/027 主分类号 G03F7/039
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