发明名称 PELLICLE INSPECTION DEVICE, EXPOSURE APPARATUS USING SAME, AND DEVICE MANUFACTURING METHOD
摘要 The pellicle inspection device of the present invention is a device that detects damage to a pellicle film disposed on an original. The pellicle inspection device includes a measuring unit configured to measure a natural vibration frequency of the pellicle film, wherein the pellicle inspection device detects damage to the pellicle film based on the value of the natural vibration frequency measured by the measuring unit. In this case, the measuring unit includes, for example, a vibration inducing unit configured to induce vibration in the pellicle film, and a sensor that detects the vibration induced by the vibration inducing unit.
申请公布号 US2011014577(A1) 申请公布日期 2011.01.20
申请号 US20100833858 申请日期 2010.07.09
申请人 CANON KABUSHIKI KAISHA 发明人 HASHIMOTO TSUTOMU
分类号 G03B27/54;G01H13/00;G01H17/00;G01N21/01;G03F1/62;G03F1/84;G03F7/20;H01L21/027 主分类号 G03B27/54
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