| 摘要 |
A method of testing a memory (14) includes generating (62, 66) a plurality of addresses, such as a test address (46), accessing (64, 68) contents of each of the plurality of addresses and storing them in storage circuitry (32, 34), performing (70) a test on the plurality of addresses, accessing (84, 86) the memory test circuitry by sending an access address to snooping circuitry (36), determining (88) if the access address matches at least one of the plurality of addresses and generating at least one hit indicator (52, 54) in response thereto, generating (92) a snoop miss indicator (27), determining (94) if it indicates a miss, if it indicates a miss, accessing (96) the memory in response to the access address, and if it does not indicate a miss, either (98) storing snooped data (23) from a interconnect master (12) to a selected portion of the storage circuitry or reading the snooped data from the selected portion of the storage circuitry to the interconnect master. |
