| 摘要 |
Provided is a test apparatus that tests a device under test, comprising a test module that transmits and receives signals to and from the device under test; and a test control section that executes a test program for testing the device under test and that instructs the test module to execute a function designated by the test program from among a plurality of functions of the test module. The test module includes a signal input/output section that transmits and receives signals to and from the device under test; and a module control section that executes a function program according to the function designated by the test program and that accesses at least one of a register and a memory in the signal input/output section.
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