发明名称 OPTIMIZED LANCET STRIP
摘要 A method for producing an analytical strip (112), in particular a lancet strip (120), is proposed. The analytical strip (112) is designed to be used in an analytical test apparatus having at least one sample taking function. In said method, at least one support strip (116) is provided in a continuous process. A plurality of lancet elements (122) is successively applied directly to the support strip (116) at least at one application point.
申请公布号 WO2011006913(A1) 申请公布日期 2011.01.20
申请号 WO2010EP60109 申请日期 2010.07.14
申请人 ROCHE DIAGNOSTICS GMBH;F. HOFFMANN-LA ROCHE AG;KONYA, AHMET;HILLER, BERND 发明人 KONYA, AHMET;HILLER, BERND
分类号 A61B5/151 主分类号 A61B5/151
代理机构 代理人
主权项
地址