发明名称 CIRCUIT TEST TOOL AND CIRCUIT TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a circuit test tool and a circuit testing method capable of stably performing a test using metal pogo pins.SOLUTION: A socket 50 is disposed between a glass ceramic substrate 32 to which an LSI chip 31 is attached, and a printed board 33 side, holds the metal pogo pins 20 conducting the socket with the LSI chip 31 or the printed board 33; and includes interference sheets 40 and 60 in which through-holes 42 and 62 are formed, respectively. The metal pogo pins 20 facing to match a pin arrangement of the LSI chip 31 and a pin arrangement of the printed board 33 pass through the through-holes.
申请公布号 JP2011013049(A) 申请公布日期 2011.01.20
申请号 JP20090156304 申请日期 2009.06.30
申请人 FUJITSU LTD 发明人 YASUZAWA KENJI
分类号 G01R31/26 主分类号 G01R31/26
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