发明名称 Measure selecting apparatus and measure selecting method
摘要 A measure selecting apparatus includes a vulnerability handling determining unit and an optimum measure selecting unit. The determining unit determines the handling status of each vulnerability of a resource in a task used to develop a measure, based on vulnerability master data in which a resource, a vulnerability of the resource, and a recovery time associated with the vulnerability are defined in an associated manner; measure master data in which a vulnerability defined in the vulnerability master data and a measure for eliminating a vulnerability are defined in an associated manner; and measure status data in which a performance status of each measure defined in the measure master data is defined. The selecting unit selects a measure, from among measures defined in the measure master data, based on a recovery time that is defined and associated with a vulnerability determined to have not been handled by the determining unit.
申请公布号 US2011016532(A1) 申请公布日期 2011.01.20
申请号 US20100923409 申请日期 2010.09.20
申请人 FUJITSU LIMITED 发明人 TADA TAKASHI;NIKAIDO HIROSHI
分类号 G06F21/00;G06Q10/00;G06Q40/00 主分类号 G06F21/00
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