发明名称 MAGNETIC TUNNEL JUNCTION (MTJ) AND METHODS, AND MAGNETIC RANDOM ACCESS MEMORY (MRAM) EMPLOYING SAME
摘要 Magnetic tunnel junctions (MTJs) and methods of forming same are disclosed. A pinned layer is disposed in the MTJ such that a free layer of the MTJ can couple to a drain of an access transistor when provided in a magnetic random access memory (MRAM) bitcell. This structure alters the write current flow direction to align the write current characteristics of the MTJ with write current supply capability of an MRAM bitcell employing the MTJ. As a result, more write current can be provided to switch the MTJ from a parallel (P) to anti-parallel (AP) state. An anti-ferromagnetic material (AFM) layer is provided on the pinned layer to fix pinned layer magnetization. To provide enough area for depositing the AFM layer to secure pinned layer magnetization, a pinned layer having a pinned layer surface area greater than a free layer surface area of the free layer is provided.
申请公布号 WO2010120918(A3) 申请公布日期 2011.01.20
申请号 WO2010US31080 申请日期 2010.04.14
申请人 QUALCOMM INCORPORATED;ZHU, XIAOCHUN;NOWAK, MATTHEW;LI, XIA;KANG, SEUNG H. 发明人 ZHU, XIAOCHUN;NOWAK, MATTHEW;LI, XIA;KANG, SEUNG H.
分类号 H01L27/115;G11B5/39;G11C11/15 主分类号 H01L27/115
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