发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING SYSTEM
摘要 PROBLEM TO BE SOLVED: To suppress oxidation of a metal film as a base during formation of a high permittivity insulating film.SOLUTION: A method of manufacturing a semiconductor device includes the processes of forming an aluminum-containing insulation film on an electrode film formed on a substrate surface by alternately repeating a process of supplying an aluminum precursor into a processing chamber in which the substrate is accommodated and exhausting the aluminum precursor from the processing chamber and a process of supplying an oxidizing or nitriding precursor into the processing chamber and exhausting the oxidizing or nitriding precursor from the processing chamber; forming the high permittivity insulation film different from the aluminum-containing insulation film on the aluminum-containing insulation film by alternately repeating a process of supplying a precursor into the processing chamber and exhausting the precursor from the processing chamber and a process of supplying an oxidizing precursor into the processing chamber and exhausting the oxidizing precursor from the processing chamber; and performing heat treatment on the substrate where the high permittivity insulation film is formed.
申请公布号 JP2011014704(A) 申请公布日期 2011.01.20
申请号 JP20090157235 申请日期 2009.07.01
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 OGAWA ARIHITO;HORII SADAYOSHI;SATO TAKETOSHI;ITAYA HIDEJI;MISE NOBUYUKI;TONOMURA OSAMU
分类号 H01L21/316;C23C16/40;H01L21/31;H01L21/318 主分类号 H01L21/316
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