发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To suppress oxidation of a metal film as a base during formation of a high permittivity insulating film.SOLUTION: A method of manufacturing a semiconductor device includes the processes of forming an aluminum-containing insulation film on an electrode film formed on a substrate surface by alternately repeating a process of supplying an aluminum precursor into a processing chamber in which the substrate is accommodated and exhausting the aluminum precursor from the processing chamber and a process of supplying an oxidizing or nitriding precursor into the processing chamber and exhausting the oxidizing or nitriding precursor from the processing chamber; forming the high permittivity insulation film different from the aluminum-containing insulation film on the aluminum-containing insulation film by alternately repeating a process of supplying a precursor into the processing chamber and exhausting the precursor from the processing chamber and a process of supplying an oxidizing precursor into the processing chamber and exhausting the oxidizing precursor from the processing chamber; and performing heat treatment on the substrate where the high permittivity insulation film is formed. |
申请公布号 |
JP2011014704(A) |
申请公布日期 |
2011.01.20 |
申请号 |
JP20090157235 |
申请日期 |
2009.07.01 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
OGAWA ARIHITO;HORII SADAYOSHI;SATO TAKETOSHI;ITAYA HIDEJI;MISE NOBUYUKI;TONOMURA OSAMU |
分类号 |
H01L21/316;C23C16/40;H01L21/31;H01L21/318 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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