发明名称 METHOD OF MANUFACTURING SPRING PROBE
摘要 PROBLEM TO BE SOLVED: To manufacture a spring probe reducing production cost and improving inspection accuracy.SOLUTION: In this manufacturing method, the spring probe 1 is produced by appropriately performing punching processes and bending processes on a substrate 10 having an electric conductivity by integrally molding a cylindrical sleeve 2, a first terminal 3 for contacting an object to be inspected, which is disposed freely in and out at the one end part of the cylindrical sleeve 2, a second terminal 4 for connecting an inspection circuit, which is disposed freely in and out at the other end part of the cylindrical sleeve 2, and a pair of coil springs 5, 5 for biasing each of the first terminal 3 and the second terminal 4.
申请公布号 JP2011012992(A) 申请公布日期 2011.01.20
申请号 JP20090155138 申请日期 2009.06.30
申请人 NIDAI SEIKO:KK 发明人 OTA YUKIO;KAMO TAKASHI
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
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