Method for Measuring threshold voltage of non-volatile memory device,申请号KR20040042117-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Method for Measuring threshold voltage of non-volatile memory device
摘要
申请公布号	KR101009392(B1)	申请公布日期	2011.01.19
申请号	KR20040042117	申请日期	2004.06.09
申请人		发明人
分类号	G11C16/34	主分类号	G11C16/34
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Scalable fault tolerant network information server

Printed circuit board material and method of manufacturing board material and intermediate block body for board material

Injection device

Method and device for producing labelled plastic bottles

A highly conserved polynucleotide sequence linked to a genetic predisposition toschizophrenia, a method of diagnosis, and applications thereof

Distributed data processing

Method and apparatus for estimating cerebral perfusion pressure

Improvements in or relating to helically wound reinforcing components for flexible tubular conduits

Spla2 inhibitor ester

Leg assembly for an offshore structure

Wireless packet data distributed communications system

High resolution image projection system and method employing lasers

Methods for regulating trkA expression

Method for purifying FSH

Smooth diamond films as low friction, long wear surfaces

Method for drying objects with fluids

Workpiece carrier with monopiece pressure plate and low gimbal point

Arrangement of an inflatable head protection system in a motor vehicle

Low inertia exercise apparatus