发明名称 GALLIUM NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a gallium nitride semiconductor device capable of easily preparing a vertical element where current flows in the thickness direction of a substrate regardless of the resistance of a gallium nitride growth layer and a buffer layer. SOLUTION: The method of manufacturing a gallium nitride semiconductor device includes the steps of forming a silicon substrate 1, buffer layers 2, 3 formed on the silicon substrate 1, and gallium nitride semiconductor layers 4, 5 on the buffer layers 2, 3, of forming a trench 12 reaching the depth of the gallium nitride semiconductor layer 4 through the silicon substrate 1 and the buffer layer 2 from the backside of the silicon substrate 1, and of coating the inner surface of the trench and the backside of the silicon substrate 1 with a metal film. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009088327(A) 申请公布日期 2009.04.23
申请号 JP20070257398 申请日期 2007.10.01
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO LTD 发明人 IWAMURO NORIYUKI
分类号 H01L21/28;H01L29/12;H01L29/41;H01L29/47;H01L29/78;H01L29/872 主分类号 H01L21/28
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